Case Study: Submicron Inspection with custom PAX-it! software

Executive Summary In semiconductor R & D, repeatable measurements at submicron scale separate signal from noise. A major US National Laboratory partnered with MIS to build a custom wafer inspection workflow that standardizes capture, motion control, and...

Addressing Asbestos Contamination Risks in Pharmaceutical Powders

Overview A recent regulatory shift is prompting heightened awareness around asbestos contamination in pharmaceutical powders, particularly those containing talc. This development stems from findings in the cosmetics industry, where asbestos was discovered in...

Increasing Throughput with Microscope Cameras and Software in Quality Control

High-resolution imaging is essential for precision and efficiency in quality control. Organizations rely on high-resolution imaging systems and microscope software solutions to streamline inspections and reduce errors. According to data from The IMARC Group, the...
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21 CFR Part 11 Compliance

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